Temperature Dependence of I-V ‎Characteristics in CNTFET Models: A ‎Comparison

Document Type : Research Paper

Authors

1 ‎Institute of Intelligent Industrial Technologies and Systems for Advanced Manufacturing ‎‎(STIIMA), National Research Council of Italy‎

2 ‎Electronic Devices Laboratory, Department of Electrical and Information Engineering, ‎Polytechnic University of Bari, Italy

Abstract

   In this paper we present a comparison of temperature dependence of I-V characteristics in Carbon Nanotube Field Effect Transistor (CNTFET) models proposed in the literature in order to identify the one more easily implementable in simulation software for electronic circuit design. At first we consider a compact, semi-empirical model, already proposed by us, performing I-V characteristic simulations at different temperatures. Our results are compared with those obtained with the Stanford-Source Virtual Carbon Nanotube Field-Effect Transistor model (VS-CNFET), obtaining I-V characteristics comparable, but with CPU calculation times much lower.

Keywords

References

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International Journal of Nanoscience and Nanotechnology
Volume 17, Issue 1
March 2021
Pages 33-39

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