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<Journal>
				<PublisherName>Iranian Nanotechnology Society</PublisherName>
				<JournalTitle>International Journal of Nanoscience and Nanotechnology</JournalTitle>
				<Issn>1735-7004</Issn>
				<Volume>20</Volume>
				<Issue>2</Issue>
				<PubDate PubStatus="epublish">
					<Year>2024</Year>
					<Month>05</Month>
					<Day>31</Day>
				</PubDate>
			</Journal>
<ArticleTitle>A Procedure to Compare CNTFET and CMOS Technologies through the Design of a SRAM Cell: A Review</ArticleTitle>
<VernacularTitle></VernacularTitle>
			<FirstPage>113</FirstPage>
			<LastPage>127</LastPage>
			<ELocationID EIdType="pii">715068</ELocationID>
			
<ELocationID EIdType="doi">10.22034/ijnn.2024.2021428.2472</ELocationID>
			
			<Language>EN</Language>
<AuthorList>
<Author>
					<FirstName>Roberto</FirstName>
					<LastName>Marani</LastName>
<Affiliation>Electronic Devices Laboratory, Department of Electrical and Information Engineering, Polytechnic University of Bari, 70126, Bari, Italy</Affiliation>

</Author>
<Author>
					<FirstName>Anna Gina</FirstName>
					<LastName>Perri</LastName>
<Affiliation>Electronic Devices Laboratory, Department of Electrical and Information Engineering, Polytechnic University of Bari, 70126, Bari, Italy</Affiliation>
<Identifier Source="ORCID">0000-0003-4949-987X</Identifier>

</Author>
</AuthorList>
				<PublicationType>Journal Article</PublicationType>
			<History>
				<PubDate PubStatus="received">
					<Year>2024</Year>
					<Month>01</Month>
					<Day>28</Day>
				</PubDate>
			</History>
		<Abstract>   &lt;em&gt;In this paper we review in depth a procedure to compare the performance of CNTFET and MOSFET devices operating in sub-threshold region for ultra-low power applications. This aim is obtained through the design of a SRAM cell. The first design is based on our CNTFET model, while for the second one we use the BSIM4 model of the ADS library. At last the comparison between the two considered technologies are quantitatively presented, showing and discussing the improvements obtained with CNTFET technology&lt;/em&gt;&lt;em&gt;. &lt;/em&gt;&lt;em&gt;All simulations are carried out&lt;/em&gt;&lt;em&gt; using the software Advanced Design System (ADS), which is compatible with the Verilog-A programming language, &lt;/em&gt;&lt;em&gt;avoiding so the problems presented in SPICE&lt;/em&gt;&lt;em&gt; used in previous designs proposed in literature.&lt;/em&gt;</Abstract>
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			<Object Type="keyword">
			<Param Name="value">nanoelectronics</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">Nanodevices</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">CNTFET</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">CMOS</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">Modelling</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">SRAM cell</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">Verilog-A</Param>
			</Object>
		</ObjectList>
<ArchiveCopySource DocType="pdf">https://www.ijnnonline.net/article_715068_599cf98fa499929b7dde0597877d1168.pdf</ArchiveCopySource>
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