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Author = R. Marani
Number of Articles: 6
A Technique, Based on Thevenin Equivalent Method, to Study the Noise Performance of Analog Circuits Involving both CNTFET and MOS Devices

Volume 19, Issue 1, March 2023, Pages 9-19

10.22034/ijnn.2023.1988468.2327

Roberto Marani; Anna Gina Perri

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  • PDF 1.3 M

Analysis of Temperature Effects in the Design of NOT Gate Based on CNTFET

Volume 18, Issue 3, August 2022, Pages 167-177

R. Marani; A. G. Perri

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  • PDF 785.89 K

Analysis of Temperature Effects in the Design of CNTFET-based Analog Circuits

Volume 18, Issue 1, March 2022, Pages 45-53

R. Marani; A. G. Perri

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  • PDF 2.03 M

A Procedure to Analyze a CNTFET-Based ‎NOT Gate with Parasitic Elements of ‎Interconnection Lines

Volume 17, Issue 3, August 2021, Pages 161-171

R. Marani; A. G. Perri

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  • PDF 650.71 K

Comparative Analysis of Noise in Current ‎Mirror Circuits based on CNTFET and MOS ‎Devices

Volume 17, Issue 2, May 2021, Pages 123-131

R. Marani; A. G. Perri

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  • PDF 1.18 M

Temperature Dependence of I-V ‎Characteristics in CNTFET Models: A ‎Comparison

Volume 17, Issue 1, March 2021, Pages 33-39

R. Marani; A. G. Perri

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  • PDF 598.68 K

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Volume 19 (2023)
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Volume 17 (2021)
Volume 16 (2020)
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